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Scan Statistics - Joseph Glaz,Sylvan Wallenstein,Joseph Naus

Anglų
2001-08-09
127,04 € 169,38 €

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In many statistical applications the scientists have to analyze the occurrence of observed clusters of events in time or space. The scientists are especially interested to determine whether an observed cluster of events has occurred by chance if it is assumed that the events are distributed independently and uniformly over time or space. Applications of scan statistics have been recorded in many areas of sc ... Visas aprašymas

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In many statistical applications the scientists have to analyze the occurrence of observed clusters of events in time or space. The scientists are especially interested to determine whether an observed cluster of events has occurred by chance if it is assumed that the events are distributed independently and uniformly over time or space. Applications of scan statistics have been recorded in many areas of science and technology including: geology, geography, medicine, minefield detection, molecular biology, photography, quality control and reliability theory and radio-optics.

Daugiau informacijos

Autorius Joseph Glaz, Sylvan Wallenstein, Joseph Naus
Leidėjas Springer US
Series Springer Series in Statistics
Išleidimo metai 2001
Viršelio tipas Kieti viršeliai
EAN 9780387988191
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127,04 € 169,38 €