(Ipf)Microelectronic Reliability - Edward B Hakim
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Text/reference spaning the theoretical concepts of reliability models and failure distributions, to GaAs microcircuit processing and test. Provides background on the development of quality assurance and verification procedures. Some of the new changes under development to cope with pressures brought
Aprašymas
Text/reference spaning the theoretical concepts of reliability models and failure distributions, to GaAs microcircuit processing and test. Provides background on the development of quality assurance and verification procedures. Some of the new changes under development to cope with pressures brought
Daugiau informacijos
| Autorius | Edward B Hakim |
|---|---|
| Leidėjas | Artech House Publishers |
| Išleidimo metai | 1989 |
| Viršelio tipas | Kieti viršeliai |
| EAN | 9780890062845 |